Restricted Research - Award List, Note/Discussion Page

Fiscal Year: 2018

1007  The University of Texas at Dallas  (74512)

Principal Investigator: Moon J Kim

Total Amount of Contract, Award, or Gift (Annual before 2011): $ 255,000

Exceeds $250,000 (Is it flagged?): Yes

Start and End Dates: 1/1/18 - 12/31/18

Restricted Research: YES

Academic Discipline: Material Science Engineering

Department, Center, School, or Institute: ECS

Title of Contract, Award, or Gift: Reliability Study of E-mode GaN HEMT Devices

Name of Granting or Contracting Agency/Entity: Semiconductor Research Corp

Program Title: N/A


We propose to investigate the reliability of enhancement-mode (E-mode) GaN HEMT devices with high resolution (HR) TEM/STEM and electrical characterization. In particular the recently discovered time dependent dielectric breakdown (TDDB) of forward biased gate will be studied on commercially available E-mode GaN HEMT devices. The location and nature of the breakdown percolation path will be determined by HR TEM/STEM and will be correlated with the electrical TDDB data. In-situ TEM technique will be utilized to study the time evolution of the TDDB failures.

Discussion: No discussion notes


Close Window