Restricted Research - Award List, Note/Discussion Page

Fiscal Year: 2014

2078  The University of Texas at San Antonio  (23638)

Principal Investigator: Ponce pedraza, Arturo

Total Amount of Contract, Award, or Gift (Annual before 2011): $ 500,000

Exceeds $250,000 (Is it flagged?): Yes

Start and End Dates: 2/17/14 <> 2/17/15

Restricted Research: YES

Academic Discipline: PHYSICS AND ASTRONOMY DEPARTMENT  

Department, Center, School, or Institute: COLLEGE OF SCIENCES  

Title of Contract, Award, or Gift: Dual Beam System (SEM/FIB) Equipment for The Kleberg Advanced Microscopy Center

Name of Granting or Contracting Agency/Entity: Army Research Office
CFDA Link: DOD
12.630

Program Title: none
CFDA Linked: Basic, Applied, and Advanced Research in Science and Engineering

Note:

The present project has been elaborated in order to achieve the acquisition of a Dual-Beam microscope to augment existing capabilities in the Kleberg Advanced Microscopy Center at the University of Texas at San Antonio (UTSA). The dual-beam system (electrons/Ga+ ions) combines the scanning electron microscopy (SEM) and the focused ion beam (FIB) technologies in the same instrument. FIB is a powerful tool for the preparation of specimens to be studied in transmission electron microscopy (TEM). The electron column enables navigation over a sample and monitoring of the FIB milling in real time. On a multiple-port specimen chamber the electron and ion column are mounted at 52 degrees to each other and interacting in the same area on the sample. For TEM studies, the samples must to be thinned until the electron-transparency, below of few tens of nanometers of thickness. For bulk materials specimen preparations by convectional methods introduce unwished artifacts that deteriorate the regions of interest and selected areas in the sample cannot be controlled as the in-situ FIB manipulation. In addition, the FIB can be used for sputtering or removal of surface materials by ablation or milling and cutting of materials. The controlled removal of materials and material modification (e.g., through implantation/doping) with ion beams are key processes in both device fabrication and micro-micromachining. A FIB system can also sputter and implant as small as 10 nm, over areas that are typically tens of microns in size. The secondary ions and electrons generated as the beam is scanned over a sample can be used for imaging enabling specific areas or features to be machined or modified. Additionally, dual-beam systems are equipped with a gas injection system, which can be used to deposit and grow materials. The ability to both sputter and deposit materials makes these systems very versatile tools for rapid prototyping and device modification. The University of Texas at San Antonio is a minority serving institution that has been strongly committed to developing high quality research and education in materials science and nanotechnology. The new instrument will help for the development of strong research and education programs in materials in the whole south Texas area, which is predominantly Hispanic and has lack of resources compared to other areas of the state. The dual beam will help to give access to first class instrumentation to many universities in South Texas. This combined with all the new instrumentation available in UTSA will reinforce the Graduate programs not only in UTSA but also in the south Texas region. The equipment will be significantly important for education and outreach programs that boost to induce minority students to attend college. Our programs in cooperation with the San Antonio Area community colleges are working in 2+2 programs for minority students and to encourage them to apply for a PhD program, all of them related with the science, technology, engineering and mathematics (STEM) educational programs referred in Broad Agency Announcement (BAA) W911NF-13-R-0008.

Discussion: No discussion notes

 

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